New microscopy technique based on position localization of scattering particles

Citation:

Oscurato, S.L., et al. New microscopy technique based on position localization of scattering particles. Opt. Express 25, 10, 11530–11549 (2017).

Date Published:

May

Abstract:

We introduce the Holographic &\#x2013; Single Scatterer Localization Microscopy in which we combine dynamical laser speckle illumination with centroid localization of backscattered light spots in order to localize isolated scattering particles. The reconstructed centroid images show very accurate particle localization, with precision much better than the width of diffraction-limited image of the particles recorded by the CCD. Furthermore, the method provides an improved resolution in distinguishing two very close scattering objects compared to the standard laser scanning techniques and can be assimilated to a confocal technique in the ability of light background rejection in three-dimensional disposition of scattering objects. The illumination is controlled via a digital holography setup based on the use of a spatial light modulator. This allows not only a high level of versatility in the illumination patterns, but also the remarkable characteristics of absence of moving mechanical parts, typical of the laser scanning techniques, and the possibility of strongly miniaturizing the setup.

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